supply of instruments for the department of physics at nabadwip vidyasagar college, nabadwip, nadia.- apparatus to determine the height of a building using a sextant apparatus to study the motion of spring and calculate (a) spring constant, (b) g apparatus to determine g and velocity for a freely falling body using digital timing technique apparatus to determine the elastic constants of a wire by searles method apparatus to determine the value of g using katers pendulum. apparatus to measure the coefficient of viscosity by stokes method. multimeter for measuring (a) resistances, (b) ac and dc voltages, (c) dc current, (d) capacitances, and (e) checking electrical fuses. apparatus to compare capacitances using de sautys bridge apparatus to measure the field strength b and its variation in a solenoid (determine db/dx) apparatus to verify the thevenin and norton theorems apparatus to verify the superposition, and maximum power transfer theorems apparatus to determine self-inductance of a coil by andersons bridge. apparatus to study response curve of a series lcr circuit and determine its (a) resonant frequency, (b) impedance at resonance, (c) quality factor q, and (d) band width apparatus to measure charge and current sensitivity and cdr of ballistic galvanometer apparatus to determine a high resistance by leakage method using ballistic galvanometer apparatus to determine self-inductance of a coil by rayleighs method apparatus to determine the mutual inductance of two coils by absolute method apparatus to measure the resistance of a mirror galvanometer by the half deflection method and to determine its figure of merit. apparatus to investigate the motion of coupled oscillators apparatus to study lissajous figures apparatus to determine the wavelength of sodium source using michelsons interferometer apparatus to determine wavelength of sodium light using fresnel biprism. apparatus to determine mechanical equivalent of heat, j, by callender and barnes constant flow method apparatus to determine the coefficient of thermal conductivity of cu by searles apparatus apparatus to determine the coefficient of thermal conductivity of a bad conductor by lee and charltons disc method. apparatus to determine the temperature coefficient of resistance by platinum resistance thermometer (prt). apparatus to study the variation of thermo-emf of a thermocouple with difference of temperature of its two junctions apparatus to calibrate a thermocouple to measure temperature in a specified range using (1) null method, (2) direct measurement using op-amp difference amplifier and to determine neutral temperature determination of the boiling point of a liquid by platinum resistance thermometer determination of the melting point of a solid with a thermocouple measurement of the coefficient of linear expansion of a solid using an optical lever apparatus to measure (a) voltage, and (b) time period of a periodic waveform using cro apparatus to design a combinational logic system for a specified truth table. apparatus to convert a boolean expression into logic circuit and design it using logic gate ics. apparatus to minimize a given logic circuit half adder, full adder and 4-bit binary adder half subtractor, full subtractor, adder-subtractor using full adder i.c. apparatus to build flip-flop (rs, clocked rs, d-type and jk) circuits using nand gates. apparatus to build jk master-slave flip-flop using flip-flop ics apparatus to build a 4-bit counter using d-type/jk flip-flop ics and study timing diagram apparatus to make a 4-bit shift register (serial and parallel) using d-type/jk flip-flop ics apparatus to design an astable multivibrator of given specifications using 555 timer. apparatus to design an astable multivibrator of given specifications using 555 timer and to design a monostable multivibrator of given specifications using 555 timer. 8085 microprocessor measurement of plancks constant using black body radiation and photo detector apparatus for photo-electric effect: photo current versus intensity and wavelength of light apparatus to determine work function of material of filament of directly heated vacuum diode apparatus to determine the plancks constant using leds of at least 4 different colours apparatus to determine the wavelength of h-alpha emission line of hydrogen atom apparatus to determine the ionization potential of mercury apparatus to determine the absorption lines in the rotational spectrum of iodine vapour apparatus to determine the value of e/m by (a) magnetic focusing or (b) bar magnet. apparatus to setup the millikan oil drop apparatus and determine the charge of an electron apparatus to show the tunnelling effect in tunnel diode using i-v characteristics apparatus to study the v-i characteristics of a zener diode and its use as voltage regulator. apparatus to study v-i and power curves of solar cells, and to find maximum power point and efficiency apparatus to study the characteristics of a bipolar junction transistor in ce configuration apparatus to design a ce transistor amplifier of a given gain (mid-gain) using voltage divider bias apparatus to study the frequency response of voltage gain of a rc coupled transistor amplifier apparatus to design a wien bridge oscillator for given frequency using an op-amp. apparatus to design a phase shift oscillator of given specifications using bjt. apparatus to study the colpitts oscillator apparatus to design a digital to analog converter (dac) of given specifications apparatus to study the analog to digital convertor (adc) ic apparatus to design an inverting amplifier using op-amp (741,351) for dc voltage of given gain apparatus to design inverting amplifier using op-amp (741,351) and study its frequency response apparatus to study the zero-crossing detector and comparator apparatus to design a precision differential amplifier of given i/o specification using opamp apparatus to investigate the use of an op-amp as an integrator apparatus to investigate the use of an op-amp as a differentiator apparatus to design a circuit to simulate the solution of a 1st/2nd order differential equation apparatus to study the characteristics of a bipolar junction transistor in cb configuration measurement of susceptibility of paramagnetic solution (quinckes tube method) apparatus to measure the magnetic susceptibility of solids apparatus to determine the coupling coefficient of a piezoelectric crystal. apparatus to measure the dielectric constant of a dielectric materials with frequency apparatus to determine the complex dielectric constant and plasma frequency of metal using surface plasmon resonance (spr) apparatus to determine the refractive index of a dielectric layer using spr apparatus to study the pe hysteresis loop of a ferroelectric crystal apparatus to draw the b-h curve of fe using solenoid and determine energy loss from hysteresis apparatus to measure the resistivity of a semiconductor (ge) with temperature by four probe method (room temperature to 150 c) and to determine its band gap apparatus to determine the hall coefficient of a semiconductor sample apparatus to measure the mutual inductance of two coaxial coils various relative orientations using a ballistic galvanometer. verification of the inverse cube law for magnetic dipoles (study the dependence of the field of a magnetic dipole on distance) and determination of the horizontal component of the earths magnetic field by deflection and oscillation magnetometers apparatus to verify the law of malus for plane polarized light apparatus to analyze elliptically polarized light by using a babinets compensator apparatus to study dependence of radiation on angle for a simple dipole antenna apparatus to determine the wavelength and velocity of ultrasonic waves in a liquid (kerosene oil, xylene, etc.) by studying the diffraction through ultrasonic grating. apparatus to study the reflection, refraction of microwaves apparatus to study polarization and double slit interference in microwaves apparatus to determine the refractive index of liquid by total internal reflection using wollastons air-film apparatus to determine the refractive index of (1) glass and (2) a liquid by total internal reflection using a gaussian eyepiece apparatus to study the polarization of light by reflection and determine the polarizing angle for air-glass interface apparatus to verify the stefans law of radiation and to determine stefans constant apparatus to determine the boltzmann constant using v-i characteristics of pn junction diode apparatus to verify brewsters law and fresnel formulae for reflection of electromagnetic waves with the help of a spectrometer, a prism and two polaroids apparatus to determine the slit width (a) using diffraction of single slit. apparatus to determine the slit width (a,b) using diffraction of double slits. apparatus to determine (1) wavelength and of he-ne light using plane diffraction grating polarimeter experiment
